Technology | Floadia Corporation.
PolarFire SONOS Technology « Microsemi
EETimes - Advantages of SONOS memory for embedded flash technology
A look at the latest developments in non-volatile memory
![PDF] Ultra-Fast Erase Method of SONOS Flash Memory by Instantaneous Thermal Excitation | Semantic Scholar](https://d3i71xaburhd42.cloudfront.net/a51a3bec399628ea9b57efa2db33ed4386489c5e/1-Figure1-1.png "PDF] Ultra-Fast Erase Method of SONOS Flash Memory by Instantaneous Thermal Excitation | Semantic Scholar")
PDF] Ultra-Fast Erase Method of SONOS Flash Memory by Instantaneous Thermal Excitation | Semantic Scholar
FG SONOS / TANOS History
IEDM2008 DG-TFT SONOS shown - BetaBlog
Technology | Floadia Corporation.
Highly Scaled Vertical Cylindrical SONOS Cell With Bilayer Polysilicon Channel for 3-D nand Flash Memory | Semantic Scholar
SONOS Split-Gate eFlash Memory | SpringerLink
Bird's eye view of the omega SONONS flash memory SONOS flash memory... | Download Scientific Diagram
Technology | Floadia Corporation.
Fabrication and characterization of fin SONOS flash memory with separated double-gate structure - ScienceDirect
Investigation and process optimization of SONOS cell's drain disturb in 2-transistor structure flash arrays - ScienceDirect
A high-endurance (≫100K) BE-SONOS NAND flash with a robust nitrided tunnel oxide/si interface | Semantic Scholar
Technology | Floadia Corporation.
Schematic diagram of a SONOS-type charge-trapping flash memory. | Download Scientific Diagram
Press Releases-1 12 June, 2007 | News | Toshiba
Fabrication of SONOS flash memory device by using engineered tunnel barrier technique | Semantic Scholar
LEE Flash G2, Flash beyond Flash | Floadia Corporation.
Cypress SONOS - A Scalable Embedded Flash Technology — Cypress Semiconductor Technical Article | ChipEstimate.com
Scalable SONOS based embedded non-volatile memory technology | Semiconductor Digest
SONOS Technology
Floadia Develops Memory Technology That Retains Ultra-high-precision Analog Data for Extended Periods | TechPowerUp
Technology | Floadia Corporation.
Extraction of Effective Charge Diffusivity in the Charge Trapping Layer of SONOS Flash Memory | SpringerLink
Total ionizing dose effects of γ and X-rays on 55 nm silicon-oxide-nitride-oxide-silicon single flash memory cell
